Your search returned 68 results.

61.

Image from Amazon.com

Professional Git / Brent Laster. by

Laster, Brent

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publication details: Indianapolis, Indiana : John Wiley & Sons, [2017]

Online resources:

Click here to access online

Availability: No items available.

62.

Image from Amazon.com

The DevOps adoption playbook : a guide to adopting DevOps in a multi-speed IT enterprise / Sanjeev Sharma. by

Sharma, Sanjeev (Information technology executive) [author.]

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Indianapolis, IN : Wiley, 2017

Online resources:

Click here to access online

Availability: No items available.

63.

Image from Amazon.com

Functional software size measurement methodology with effort estimation and performance indication / Jasveer Singh. by

Singh, Jasveer, 1955- [author.]

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : Wiley : IEEE Press, 2017

Online resources:

Click here to access online

Availability: No items available.

64.

Image from Amazon.com

Artificial neural network for software reliability prediction / by Manjubala Bisi and Neeraj Kumar Goyal. by

Series: Performability engineering series

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Hoboken, NJ : John Wiley & Sons ; Beverly, MA : Scrivener Publishing, 2017

Online resources:

Click here to access online

Availability: No items available.

65.

Image from Amazon.com

Software quality : concepts and practice / Daniel Galin. by

Galin, Daniel [author.]

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Hoboken, NJ : John Wiley & Sons, 2018Copyright date: �2018

Online resources:

Click here to access online

Availability: No items available.

66.

Image from Amazon.com

Analytic methods in systems and software testing / edited by Ron S. Kenett, KPA, Israel and Neaman Institute, Technion, Israel, Fabrizio Ruggeri, CNR-IMATI, Italy, Frederick W. Faltin, the Faltin Group, and Virginia Tech, USA. by

Edition: 1 edition.

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Hoboken, NJ, USA : John Wiley & Sons, Inc., 2018Copyright date: �2018

Online resources:

Click here to access online

Availability: No items available.

67.

Image from Amazon.com

Evolving software processes : trends and future directions / edited by Arif Ali Khan, Dac-Nhuong Le. by

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Hoboken, NJ : Wiley ; Beverly, MA : Scrivener Publishing, 2022

Online resources:

Click here to access online

Availability: No items available.

68.

Image from Amazon.com

Handbook of software fault localization : foundations and advances / edited by W. Eric Wong, T. H. Tse. by

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc ; Piscataway, NJ : IEEE Press, 2023Copyright date: �2023

Online resources:

Click here to access online

Availability: No items available.

Not finding what you're looking for?

Make a purchase suggestion

NLU Meghalaya Library

Online Public Access Catalogue (OPAC)

Refine your search

Availability

Authors

Collections

Item types

Series

Places

Topics

Titles

Your search returned 68 results.