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241.

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Understanding artificial intelligence : fundamentals and applications / Albert (Chun-Chen) Liu, Oscar Ming Kin Law, Iain Law. by

Liu, Albert Chun-Chen [author.]
Law, Oscar Ming Kin [author.]
Law, Iain [author.]

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : Wiley-IEEE Press, [2022]

Online resources:

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242.

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Security technologies and social implications / edited by Garik Markarian, Ruza Karlovic, Holger Nitsch, Krishna Chandramouli. by

Markarian, Garik [editor.]
Karlovic, Ru�za [editor.]
Nitsch, Holger [editor.]
Chandramouli, Krishna [editor.]

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2023]

Online resources:

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243.

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Communication and catastrophic events : strategic risk and crisis management / edited by H. Dan O'Hair, University of Kentucky, Lexington, KY and Mary John O'Hair, University of Kentucky, Lexington, KY. by

O'Hair, Dan [editor.]
O'Hair, Mary John [editor.]

Series: Communicating science in times of crisis

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., 2023Copyright date: �2023

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244.

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Blockchain for real world applications / Rishabh Garg. by

Garg, Rishabh [author.]

Material type:

Text; Format: available online remote

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; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., 2023Copyright date: �2023

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245.

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Handbook of software fault localization : foundations and advances / edited by W. Eric Wong, T. H. Tse. by

Wong, W. Eric [editor.]
Tse, T. H [editor.]
John Wiley & Sons [publisher.]

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc ; Piscataway, NJ : IEEE Press, 2023Copyright date: �2023

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246.

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Methods and techniques in deep learning : advancements in mmWave radar solutions / Avik Santra [and 5 others], Infineon Technologies, Munich, Germany. by

Santra, Avik [author.]

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Piscataway, NJ : IEEE Press ; Hoboken, New Jersey : John Wiley & Sons, Inc., [2023]

Other title:

Advancements in mmWave radar solutions
Advancements in millimeter wave radar solutions

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247.

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Deep learning approaches for security threats in IoT environments / Mohamed Abdel-Basset, Zagazig University, Egypt, Nour Moustafa, UNSW Canberra at the Australian Defence Force Academy, Australia, Hossam Hawash, Zagazig University, Egypt. by

Abdel-Basset, Mohamed, 1985- [author.]
Moustafa, Nour [author.]
Hawash, Hossam [author.]

Edition: First edition.

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2023]

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248.

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Innovation project management : methods, case studies, and tools for managing innovation projects / Harold Kerzner. by

Kerzner, Harold [author.]

Material type:

Text; Format: available online remote

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; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2019]

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249.

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Cyber threat intelligence / Martin Lee. by

Lee, Martin (Computer security expert) [author.]

Material type:

Text; Format: available online remote

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; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2023]

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250.

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Distributed systems : theory and applications / Ratan K. Ghosh, Hiranmay Ghosh. by

Ghosh, Ratan K [author.]
Ghosh, Hiranmay [author.]

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc. ; Piscataway, NJ : IEEE Press, [2023]

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251.

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Practitioner's guide to operationalizing data governance / Mary Anne Hopper. by

Hopper, Mary Anne [author.]

Series: Wiley and SAS business series

Material type:

Text; Format: available online remote

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; Literary form: Not fiction

Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2023]

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252.

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How to measure anything in cybersecurity risk / Douglas W. Hubbard, Richard Seiersen. by

Hubbard, Douglas W, 1962- [author.]
Seiersen, Richard, 1967- [author.]

Edition: Second edition.

Material type:

Text; Format: available online remote

remote

; Literary form: Not fiction

Publisher: Hoboken, New Jersey : Wiley, [2023]

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